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3rd IEEE International GHz/Gbps Test Workshop (GTW’07)
June 18-20, 2007
Novotel Vermar Hotel
Póvoa de Varzim, Portugal
Held in conjunction with 13th IEEE International Mixed Signals Test Workshop (IMSTW 07)

http://www.fe.up.pt/gtw07

CALL FOR PAPERS

Scope -- Author Information -- Location -- Committees

Scope

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Electronic circuits running in the multi-GHz clock range and/or including I/O capable of multi-Gbps data rates are now increasingly common. The characterization, production testing, and diagnosis of such circuits pose significant challenges. GTW’07 is a workshop sponsored by the IEEE Computer Society Test Technology Technical Council that specifically addresses problems and solutions related to ATE and test methodologies concerning issues that arise with circuits running at such GHz clock and/or Gbps data rates. GTW'07 will offer a focused forum for experts, as well as for members of the community with a particular interest in this rapidly expanding specialized field.

Areas of interest include but are not limited to:

  • Tester architecture and circuitry to provide and support high-speed analog signal sourcing/generation and response capture/sampling
  • Embedded and external (hybrid) schemes and circuits for sourcing and capturing high speed signals
  • Low bandwidth/Low-cost testing/testers of GHz/Gpbs circuits
  • BIT/BIST for GHz/Gbps circuits
  • Passive and active loopback testing
  • Jitter generation and analysis techniques, using embedded, external, and hybrid circuitry
  • Driving and measuring specifications of I/Os with differential signaling
  • High-speed/multi-channel test problems and solutions (test fixturing, noise, signal integrity etc)
  • On-chip infrastructure IP for accurate on-chip timing, voltage, and current measurements
  • Noise modeling and characterization of channels, cabling, sources, receivers, etc.
  • Device interface circuitry, and tradeoffs in accuracy and bandwidth
  • Tradeoffs between yield, ATE overall timing accuracy (OTA), test environment specifications, and I/O timing specifications
  • DFT and design for manufacturing (DFM) of Gbit/s I/Os
  • High-speed I/O test power management
  • Test stimulus and response data transfer and processing for go/no-go testing and diagnosis

Author Information

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Prospective authors are invited to submit extended abstracts (1,000 words) or full papers (including an abstract of 50 words). Each submission should include: title, full name and affiliation of all authors, and keywords. Also, identify a contact author and include a complete correspondence address, phone number, fax number, and e-mail address. All submissions are to be made electronically through the GTW'07 website. Proposals for panel discussions are also invited.

Important Dates:
Submission deadline: March 25th, 2007
Notification of acceptance: April 6th, 2007
Camera-ready full papers: May 6th, 2007

Location

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The Workshop will take place in the Novotel Vermar Hotel in the city of Póvoa de Varzim. Located 18 km north of the Porto International airport, and with easy access to downtown Porto, Póvoa de Varzim lies in a sandy coastal plain in the northwest region of the country known as Costa Verde. Inland, there are several historic and interesting cities, towns and villages that fascinate the passing tourist and bear testimony of the ancient beginnings of modern Portugal.

Committees

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General Chair
D. Keezer, Georgia Tech., USA

Local Chair
J. Machado da Silva, U. Porto, Portugal

Program Co-Chairs
A. Chatterjee, Gerogia Tech, USA
W. R. Eisenstadt, U. Florida, USA

Publicity Chair
D. Gizopoulos, U. Piraeus, Greece

Publications Chair
Vitor G. Tavares, U. Porto, Portugal

PROGRAM COMMITTEE (to include):

M. A. d’Abreu, Sun Microsystems
J. A. Abraham, UT Austin
R. Aitken, Artisan
K. Arabi, PMC-Sierra
Y. Cai, Agere
T. Cheng, UCSB
A. Crouch, Inovys
W. R. Eisenstadt, U. Florida
J. Figueras, U. Politecnic Catalunya
C. Force, Texas Instruments
H. Haggag, National Semiconductor
M. Li, Wavecrest
S.-I. Liu, National Taiwan U.
W. Maichen, Teradyne
W. Mann, SWTW
A. Meixner, Intel
M. Omana, U. Bologna
S. Ozev, Duke U.
G. Roberts, McGill U.
M. Slamani, IBM
M. Soma, U. Washington
L. Song, Teradyne
S. Sunter, LogicVision
T. Yamaguchi, Advantest
J. Moreira, Verigy
M. Howieson, Thin Film Technology

Ex-Officio
A. Ivanov, U. British Columbia, Canada

Liaisons
North American Liason
S. Sunter, LogicVision

Local Organization
Finance: J. C. Ferreira
Audiovisuals: A. J. Araújo
Local information: J. Martins Ferreira
Industry liaisons: J. S. Matos

Faculty of Engineering, U. Porto
4200-465 Porto, Portugal
Tel.: +351 225081502
Fax: +351 225081443
E-mail: jmf@fe.up.pt

For more information, visit us on the web at: http://www.fe.up.pt/gtw07

The 3rd IEEE International GHz/Gbps Test Workshop (GTW’07) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).


IEEE Computer Society- Test Technology Technical Council

TTTC CHAIR
André IVANOV
University of British Columbia - Canada
Tel. +1-604-822-6936
E-mail ivanov@ece.ubc.ca

SENIOR PAST CHAIR
Yervant ZORIAN
Virage Logic - USA
Tel. +1-510-360-8035
E-mail yervant.zorian@viragelogic.com

TTTC 2ND VICE CHAIR
Joan FIGUERAS
Universitat Politècnica de Catalunya - Spain
Tel. +34-93-401-6603
E-mail figueras@eel.upc.es

FINANCE
Adit D. SINGH
Auburn University - USA
Tel. +1-334-844-1847
E-mail adsingh@eng.auburn.edu

DESIGN & TEST MAGAZINE
Tim CHENG
University of California, Santa Barbara - USA
Tel. +1-805-893-72942
E-mail timcheng@ece.ucsb.edu

TECHNICAL MEETINGS
Chen-Huan CHIANG

Lucent Technologies
- USA
Tel. +1-732-949-5539
E-mail chenhuan@lucent.com

TECHNICAL ACTIVITIES
Victor Hugo CHAMPAC
Instituto Nacional de Astrofisica - Mexico
Tel.+52-22-470-517
E-mail champac@inaoep.mx

ASIA & SOUTH PACIFIC
Hideo FUJIWARA
Nara Institute of Science and Technology - Japan
Tel. +81-74-372-5220
E-mail fujiwara@is.aist-nara.ac.jp

LATIN AMERICA
Marcelo LUBASZEWSKI
Federal University of Rio Grande do Sul - Brazil
Tel. +34-93-401-6603
E-mail luba@vortex.ufrgs.br

NORTH AMERICA
William R. MANN
Tel. +1-949-645-3294
E-mail william.mann@ieee.org

COMMUNICATIONS
Adit D. SINGH
Auburn University - USA
Tel. +1-334-844-1847
E-mail adsingh@eng.auburn.edu

INDUSTRY ADVISORY BOARD
Yervant ZORIAN
Virage Logic - USA
Tel. +1-510-360-8035
E-mail yervant.zorian@viragelogic.com

 

PAST CHAIR
Paolo PRINETTO
Politecnico di Torino - Italy
Tel. +39-011-564-7007
E-mail Paolo.Prinetto@polito.it

TTTC 1ST VICE CHAIR
Adit D. SINGH
Auburn University - USA
Tel. +1-334-844-1847
E-mail adsingh@eng.auburn.edu

SECRETARY
Christian LANDRAULT
LIRMM - France
Tel. +33-4-674-18524
E-mail landrault@lirmm.fr

INTERNATIONAL TEST CONFERENCE
Jill E. SIBERT
Raspberry Comm.
- USA
Tel. +1-484-894-1111
E-mail jill_sibert@raspberrycom.com

TEST WEEK COORDINATION
Yervant ZORIAN
Virage Logic - USA
Tel. +1-510-360-8035
E-mail yervant.zorian@viragelogic.com

TUTORIALS AND EDUCATION
Dimitris GIZOPOULOS

University of Piraeus
- Greece
Tel. +30-210-414-2372
E-mail dgizop@unipi.gr

STANDARDS
Rohit KAPUR

Synopsys
- USA
Tel. +1-650-934-1487
E-mail rkapur@synopsys.com

EUROPE
Zebo PENG
Linköping University - Sweden
Tel. +46-13-282-067/-281-000
E-mail zpe@ida.liu.se

MIDDLE EAST & AFRICA
Ibrahim HAJJ
American University of Beirut - Lebanon
Tel. +961-1-341-952
E-mail ihajj@aub.edu.lb

STANDING COMMITTEES
Michael NICOLAIDIS
TIMA Laboratory - France
Tel. +33-4-765-74696
E-mail michael.nicolaidis@imag.fr

ELECTRONIC MEDIA
Alfredo BENSO
Politecnico di Torino - Italy
Tel. +39-011-564-7080
E-mail alfredo.benso@polito.it


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